Low temperature transport spectroscopy of defects using Schottky-barrier MOSFETs
| Autor: | Calvet, L.E., Meshkov, G.A., Strupiechonski, E., Toubestani, D., Snyder, J.P., Fortuna, F., Wernsdorfer, W. |
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| Zdroj: | In Physica B: Physics of Condensed Matter 15 December 2009 404(23-24):5136-5139 |
| Databáze: | ScienceDirect |
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