Charge carrier removal rates in n-type silicon and silicon carbide subjected to electron and proton irradiation

Autor: Kozlovski, V.V., Emtsev, V.V., Ivanov, A.M., Lebedev, A.A., Oganesyan, G.A., Poloskin, D.S., Strokan, N.B.
Zdroj: In Physica B: Physics of Condensed Matter 15 December 2009 404(23-24):4752-4754
Databáze: ScienceDirect