Influence of GaN polarity and intermediate-temperature buffer layers on strain relaxation and defects

Autor: Peng, C.X., Weng, H.M., Zhu, C.F., Ye, B.J., Zhou, X.Y., Han, R.D., Fong, W.K., Surya, C.
Zdroj: In Physica B: Physics of Condensed Matter 2007 391(1):6-11
Databáze: ScienceDirect