Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2
| Autor: | Pi, X.D., Coleman, P.G. *, Harding, R., Davies, G., Gwilliam, R.M., Sealy, B.J. |
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| Zdroj: | In Physica B: Physics of Condensed Matter 31 December 2003 340-342:1094-1098 |
| Databáze: | ScienceDirect |
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