Hall effect and surface characterization of Cu 2S and CuS films deposited by RF reactive sputtering
| Autor: | He, Y.B. *, Polity, A., Österreicher, I., Pfisterer, D., Gregor, R., Meyer, B.K., Hardt, M. |
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| Zdroj: | In Physica B: Physics of Condensed Matter 2001 308:1069-1073 |
| Databáze: | ScienceDirect |
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