Interval Simulated Annealing applied to Electrical Impedance Tomography image reconstruction with fast objective function evaluation

Autor: Martins, Thiago de Castro, Tsuzuki, Marcos de Sales Guerra, Camargo, Erick Dario León Bueno de, Lima, Raul Gonzalez, Moura, Fernando Silva de, Amato, Marcelo Brito Passos
Zdroj: In Computers and Mathematics with Applications September 2016 72(5):1230-1243
Databáze: ScienceDirect