Influence of the deposition temperature on the optical and electrical properties of TiN film by spectroscopic ellipsometry

Autor: Ma, Qunchao, Shi, Xinwei, Bi, Longtao, Li, Jing, Zhou, Qiang, Zhu, Bailin
Zdroj: In Superlattices and Microstructures March 2021 151
Databáze: ScienceDirect