Influence of AlN thickness on AlGaN epilayer grown by MOCVD

Autor: Jayasakthi, M., Juillaguet, S., Peyre, H., Konczewicz, L., Baskar, K., Contreras, S.
Zdroj: In Superlattices and Microstructures October 2016 98:515-521
Databáze: ScienceDirect