Electronic transport mechanism in intrinsic and doped nanocrystalline silicon films deposited by RF-magnetron sputtering at low temperature

Autor: Benlakehal, D., Belfedal, A., Bouizem, Y., Sib, J.D., Chahed, L., Zellama, K.
Zdroj: In Superlattices and Microstructures December 2016 100:228-236
Databáze: ScienceDirect