Raman measurements of Ge 1− xMn x epilayers

Autor: Tay, L.-L., Rowell, N.L., Ayoub, J.-P., Berbezier, I., Morresi, L., Pinto, N.
Zdroj: In Superlattices and Microstructures 2008 44(4):315-322
Databáze: ScienceDirect