Characterisation of defects in rare earth implanted GaN by deep level transient spectroscopy
| Autor: | Colder, A., Marie, P., Wojtowicz, T., Ruterana, P., Eimer, S., Méchin, L., Lorenz, K., Wahl, U., Alves, E., Matias, V., Mamor, M. |
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| Zdroj: | In Superlattices and Microstructures 2004 36(4):713-719 |
| Databáze: | ScienceDirect |
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