High-G drop impact response and failure analysis of a chip packaged printed circuit board

Autor: Jenq, S.T., Sheu, H.S., Yeh, Chang-Lin, Lai, Yi-Shao, Wu, Jenq-Dah
Zdroj: In International Journal of Impact Engineering 2007 34(10):1655-1667
Databáze: ScienceDirect