Depth profile analysis of 100 keV Ni ions in Si 〈100〉 substrate
| Autor: | Alam, Md. Akhlak, Tiwari, M.K., Devi, Devarani, Tripathi, Shilpa, Trivedi, Ayushi, Ojha, Sunil, Singh, Rashmi, Gupta, Mukul |
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| Zdroj: | In Spectrochimica Acta Part B: Atomic Spectroscopy August 2023 206 |
| Databáze: | ScienceDirect |
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