Bias stress effects investigated in charge depletion and accumulation regimes for inkjet-printed perylene diimide organic transistors

Autor: Grimaldi, I.A., Barra, M., Carella, A., Di Girolamo, F.V., Loffredo, F., Minarini, C., Villani, F., Cassinese, A.
Zdroj: In Synthetic Metals 15 July 2013 176:121-127
Databáze: ScienceDirect