The interaction between vapor-deposited Al atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy
| Autor: | Fisher, G.L, Hooper, A, Opila, R.L, Jung, D.R, Allara, D.L, Winograd, N |
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| Zdroj: | In Journal of Electron Spectroscopy and Related Phenomena January 1999 98-99:139-148 |
| Databáze: | ScienceDirect |
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