Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators

Autor:	Paparazzo, E. *
Zdroj:	In Journal of Electron Spectroscopy and Related Phenomena 2005 143(2):219-231
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect