Sensitivity of Fresnel projection microscopy for observations of magnetic nano-particles
Autor: | Purcell, S.T. *, Binh, Vu Thien |
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Zdroj: | In Journal of Magnetism and Magnetic Materials 1999 198:617-619 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Purcell, S.T. *, Binh, Vu Thien |
---|---|
Zdroj: | In Journal of Magnetism and Magnetic Materials 1999 198:617-619 |
Databáze: | ScienceDirect |
Externí odkaz: |