The FMR line width and the structure in YIG films deposited by MOD on silicon (1 0 0)
Autor: | Assis, L.K.C.S., Abrão, J.E., Carvalho, A.S., Gonçalves, L.A.P., Galembeck, A., Padrón-Hernández, E. |
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Zdroj: | In Journal of Magnetism and Magnetic Materials 15 February 2023 568 |
Databáze: | ScienceDirect |
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