A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers
| Autor: | Prikhodko, A.S., Zallo, E., Calarco, R., Borgardt, N.I. |
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| Zdroj: | In Ultramicroscopy December 2024 267 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect