A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning

Autor: Materna Mikmeková, Eliška, Materna, Jiří, Konvalina, Ivo, Mikmeková, Šárka, Müllerová, Ilona, Asefa, Tewodros
Zdroj: In Ultramicroscopy August 2024 262
Databáze: ScienceDirect