“Depo-all-around”: A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples
| Autor: | Demuth, Thomas, Fuchs, Till, Beyer, Andreas, Janek, Jürgen, Volz, Kerstin |
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| Zdroj: | In Ultramicroscopy March 2024 257 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect