Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide
| Autor: | Chen, Chen, Ghosh, Saptarsi, Adams, Francesca, Kappers, Menno J., Wallis, David J., Oliver, Rachel A. |
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| Zdroj: | In Ultramicroscopy December 2023 254 |
| Databáze: | ScienceDirect |
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