Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM
| Autor: | Toyama, Satoko, Seki, Takehito, Kanitani, Yuya, Kudo, Yoshihiro, Tomiya, Shigetaka, Ikuhara, Yuichi, Shibata, Naoya |
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| Zdroj: | In Ultramicroscopy August 2022 238 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect