Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN

Autor: Grieb, Tim, Krause, Florian F., Müller-Caspary, Knut, Ahl, Jan-Philipp, Schowalter, Marco, Oppermann, Oliver, Hertkorn, Joachim, Engl, Karl, Rosenauer, Andreas
Zdroj: In Ultramicroscopy August 2022 238
Databáze: ScienceDirect