A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials
| Autor: | Rajput, Nitul S, Sloyan, Karen, Anjum, Dalaver H., Chiesa, Matteo, Ghaferi, Amal Al |
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| Zdroj: | In Ultramicroscopy May 2022 235 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect