In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning
| Autor: | Noisternig, Stefan Manuel, Rentenberger, Christian, Karnthaler, H. Peter |
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| Zdroj: | In Ultramicroscopy May 2022 235 |
| Databáze: | ScienceDirect |
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