Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography
| Autor: | Wei, Xukang, Urbach, H. Paul, van der Walle, Peter, Coene, Wim M.J. |
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| Zdroj: | In Ultramicroscopy October 2021 229 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect