Complementary LEEM and eV-TEM for imaging and spectroscopy
| Autor: | Neu, Peter S., Geelen, Daniël, Thete, Aniket, Tromp, Rudolf M., van der Molen, Sense Jan |
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| Zdroj: | In Ultramicroscopy March 2021 222 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Neu, Peter S., Geelen, Daniël, Thete, Aniket, Tromp, Rudolf M., van der Molen, Sense Jan |
|---|---|
| Zdroj: | In Ultramicroscopy March 2021 222 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect