Active calibration reference of minimized height for characterization of scanning thermal microscopy systems
| Autor: | Janus, Paweł, Szmigiel, Dariusz, Sierakowski, Andrzej, Rudek, Maciej, Gotszalk, Teodor |
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| Zdroj: | In Ultramicroscopy February 2021 221 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect