Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations
| Autor: | De wael, Annelies, De Backer, Annick, Van Aert, Sandra |
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| Zdroj: | In Ultramicroscopy December 2020 219 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect