Atom column detection from simultaneously acquired ABF and ADF STEM images
| Autor: | Fatermans, J., den Dekker, A.J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., Van Aert, S. |
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| Zdroj: | In Ultramicroscopy December 2020 219 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect