Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations
| Autor: | Aarholt, Thomas, Frodason, Ymir K., Prytz, Øystein |
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| Zdroj: | In Ultramicroscopy February 2020 209 |
| Databáze: | ScienceDirect |
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