Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Autor: Mahr, Christoph, Müller-Caspary, Knut, Ritz, Robert, Simson, Martin, Grieb, Tim, Schowalter, Marco, Krause, Florian F., Lackmann, Anastasia, Soltau, Heike, Wittstock, Arne, Rosenauer, Andreas
Zdroj: In Ultramicroscopy January 2019 196:74-82
Databáze: ScienceDirect