Exploring possibilities of band gap measurement with off-axis EELS in TEM
| Autor: | Korneychuk, Svetlana, Partoens, Bart, Guzzinati, Giulio, Ramaneti, Rajesh, Derluyn, Joff, Haenen, Ken, Verbeeck, Jo |
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| Zdroj: | In Ultramicroscopy June 2018 189:76-84 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect