Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards
| Autor: | Craven, Alan J., Sala, Bianca, Bobynko, Joanna, MacLaren, Ian |
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| Zdroj: | In Ultramicroscopy March 2018 186:66-81 |
| Databáze: | ScienceDirect |
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