Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy
| Autor: | Bangert, U., Stewart, A., O’Connell, E., Courtney, E., Ramasse, Q., Kepaptsoglou, D., Hofsäss, H., Amani, J., Tu, J.-S., Kardynal, B. |
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| Zdroj: | In Ultramicroscopy May 2017 176:31-36 |
| Databáze: | ScienceDirect |
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