Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure

Autor: Alania, M., Altantzis, T., De Backer, A., Lobato, I., Bals, S., Van Aert, S.
Zdroj: In Ultramicroscopy June 2017 177:36-42
Databáze: ScienceDirect