Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure
Autor: | Alania, M., Altantzis, T., De Backer, A., Lobato, I., Bals, S., Van Aert, S. |
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Zdroj: | In Ultramicroscopy June 2017 177:36-42 |
Databáze: | ScienceDirect |
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