Structural defects in cubic semiconductors characterized by aberration-corrected scanning transmission electron microscopy
| Autor: | Arroyo Rojas Dasilva, Yadira, Kozak, Roksolana, Erni, Rolf, Rossell, Marta D. |
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| Zdroj: | In Ultramicroscopy May 2017 176:11-22 |
| Databáze: | ScienceDirect |
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