Parallel preparation of plan-view transmission electron microscopy specimens by vapor-phase etching with integrated etch stops
| Autor: | English, Timothy S., Provine, J, Marshall, Ann F., Koh, Ai Leen, Kenny, Thomas W. |
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| Zdroj: | In Ultramicroscopy July 2016 166:39-47 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect