Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si
| Autor: | Friedman, Lawrence H., Vaudin, Mark D., Stranick, Stephan J., Stan, Gheorghe, Gerbig, Yvonne B., Osborn, William, Cook, Robert F. |
|---|---|
| Zdroj: | In Ultramicroscopy April 2016 163:75-86 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect