A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
| Autor: | Babinsky, K., De Kloe, R., Clemens, H., Primig, S. |
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| Zdroj: | In Ultramicroscopy September 2014 144:9-18 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect