Height drift correction in non-raster atomic force microscopy
| Autor: | Meyer, Travis R., Ziegler, Dominik, Brune, Christoph, Chen, Alex, Farnham, Rodrigo, Huynh, Nen, Chang, Jen-Mei, Bertozzi, Andrea L., Ashby, Paul D. |
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| Zdroj: | In Ultramicroscopy February 2014 137:48-54 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect