Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum
| Autor: | Brown, Jason, Kocher, Paul, Ramanujan, Chandra S, Sharp, David N, Torimitsu, Keiichi, Ryan, John F |
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| Zdroj: | In Ultramicroscopy October 2013 133:62-66 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect