A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
| Autor: | Tromp, R.M., Hannon, J.B., Wan, W., Berghaus, A., Schaff, O. |
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| Zdroj: | In Ultramicroscopy April 2013 127:25-39 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Tromp, R.M., Hannon, J.B., Wan, W., Berghaus, A., Schaff, O. |
|---|---|
| Zdroj: | In Ultramicroscopy April 2013 127:25-39 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect