Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice

Autor: Bennett, S.E., Ulfig, R.M., Clifton, P.H., Kappers, M.J., Barnard, J.S., Humphreys, C.J., Oliver, R.A.
Zdroj: In Ultramicroscopy 2011 111(3):207-211
Databáze: ScienceDirect