Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice
Autor: | Bennett, S.E., Ulfig, R.M., Clifton, P.H., Kappers, M.J., Barnard, J.S., Humphreys, C.J., Oliver, R.A. |
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Zdroj: | In Ultramicroscopy 2011 111(3):207-211 |
Databáze: | ScienceDirect |
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