Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination
| Autor: | Valamanesh, M., Langlois, C., Alloyeau, D., Lacaze, E., Ricolleau, C. |
|---|---|
| Zdroj: | In Ultramicroscopy 2011 111(2):149-154 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect