Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns
| Autor: | Britton, T.B., Maurice, C., Fortunier, R., Driver, J.H., Day, A.P., Meaden, G., Dingley, D.J., Mingard, K., Wilkinson, A.J. |
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| Zdroj: | In Ultramicroscopy 2010 110(12):1443-1453 |
| Databáze: | ScienceDirect |
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