Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging
| Autor: | Stan, G., Krylyuk, S., Davydov, A.V., Vaudin, M.D., Bendersky, L.A., Cook, R.F. |
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| Zdroj: | In Ultramicroscopy 2009 109(8):929-936 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect