A new approach for explanation of specimen rupture under high electric field
Autor: | Mikhailovskij, I.M., Wanderka, N., Storizhko, V.E., Ksenofontov, V.A., Mazilova, T.I. |
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Zdroj: | In Ultramicroscopy 2009 109(5):480-485 |
Databáze: | ScienceDirect |
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