A new approach for explanation of specimen rupture under high electric field

Autor: Mikhailovskij, I.M., Wanderka, N., Storizhko, V.E., Ksenofontov, V.A., Mazilova, T.I.
Zdroj: In Ultramicroscopy 2009 109(5):480-485
Databáze: ScienceDirect