Effect of amorphous layers on the interpretation of restored exit waves
| Autor: | Aert, S. Van, Chang, L.Y., Bals, S., Kirkland, A.I., Tendeloo, G. Van |
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| Zdroj: | In Ultramicroscopy 2009 109(3):237-246 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Aert, S. Van, Chang, L.Y., Bals, S., Kirkland, A.I., Tendeloo, G. Van |
|---|---|
| Zdroj: | In Ultramicroscopy 2009 109(3):237-246 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect